| NCID | DA00601962 |
| 名称(HDNG) | Feldman, Leonard C. |
| から見よ(SF) | フェルドマン, L. C. |
| 注記(NOTE) | His Materials analysis by ion channeling, 1982: CIP t.p. (Leonard C. Feldman; Bell Laboratories, Murray Hill, NJ)
Mayer, J.W. Fundamentals of surface and thin film analysis, c1986 |
| LCAID | 82064449 |